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A Patent Data Meta-Path-based Technological Risk Prediction Method

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Year: 2025
Type: article
Source: International Journal of Software Engineering and Knowledge Engineering
DOI: 10.1142/s0218194025410013
Authors: Weidong Liu, Jiamin Zhang, Yuling Yang, Fuming Ye
Institutions: Institute of Scientific and Technical Information of China, Inner Mongolia University
Language: English

Topic: Intellectual Property and Patents
Subfield: Management of Technology and Innovation
Field: Business, Management and Accounting
Domain: Social Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, China Postdoctoral Science Foundation
Awards: G1087852652, G3842510892, G6012242497
OpenAlex ID: W4408226126
FWCI:
Cites: 16
Cited by:
Related to: 10
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