A Patent Data Meta-Path-based Technological Risk Prediction Method
Year: 2025
Type: article
Authors: Weidong Liu, Jiamin Zhang, Yuling Yang, Fuming Ye
Language: English
Subfield: Management of Technology and Innovation
Domain: Social Sciences
Open Access status: closed
Awards: G1087852652, G3842510892, G6012242497
OpenAlex ID: W4408226126
