Work

Enhanced di/dt-RC Sensing Structure for Accurate Dynamic Current Measurement in Paralleled SiC MOSFETs

Year: 2025

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2025.3549039

Authors: Che-Wei Chang, Dong Dong

Institution: Virginia Tech

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Office of Energy Efficiency and Renewable Energy

OpenAlex ID: W4408235641

FWCI: 1.36

Cites: 34

Cited by: 6

Related to: 10