Work

True random calibration method and application of tapped delay line-TDC with spontaneous parametric down-conversion system

Year: 2025

Type: article

Source: Measurement

DOI: 10.1016/j.measurement.2025.117240

Authors: Zhihan Jin, Bing Yu, Junwei Chu, Qing Kang, Jianjun Li

Institutions: University of Science and Technology of China, Chinese Academy of Sciences, Hefei Institutes of Physical Science

Language: English

Topic: Advancements in PLL and VCO Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funder: National Natural Science Foundation of China

Award: G6558287216

OpenAlex ID: W4408252683

FWCI: 0.622

Cites: 44

Cited by: 3

Related to: 10