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From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing

Year: 2025

Type: article

Source: IEEE Microwave Magazine

DOI: 10.1109/mmm.2024.3524870

Authors: JP Teyssier, Joel Dunsmore, Suren Singh, Nizar Messaoudi, Sam Kusano, Johan Ericsson

Institution: Keysight Technologies (United States)

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408254205

FWCI:

Cites: 39

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Related to: 10