Advances in Hardware and Measurement Techniques to Enable Better Millimeter-Wave Device Characterization and Modeling
Year: 2025
Type: article
Source: IEEE Microwave Magazine
Authors: Marco Spirito, Jon Martens
Institutions: Delft University of Technology, Anritsu (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408254245