Work

Advancing RF GaN HEMTs: A Perspective on Measurement and Characterization Techniques

Year: 2025

Type: article

Source: IEEE Microwave Magazine

DOI: 10.1109/mmm.2024.3524846

Authors: Gian Piero Gibiino, Luís Cótimos Nunes, Nicholas C. Miller

Institutions: University of Bologna, University of Aveiro, Michigan State University

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408254248

FWCI: 4.847

Cites: 95

Cited by: 15

Related to: 10