Work

A Multi-Modal AI Inspection System for Laser Labels

Year: 2024

Type: conference-paper

Source: IEEE Region 10 Conference (TENCON)

DOI: 10.1109/tencon61640.2024.10902911

Authors: Min Sik Byun, Malcolm Yoke Hean Low, David Weidong Lin

Institution: Singapore Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408258241

FWCI: 0.755

Cites: 4

Cited by: 1

Related to: 10