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Printed Circuit Board Defect Detection Using YOLOv8s and TensorRT

Year: 2024

Type: conference-paper

Source: IEEE Region 10 Conference (TENCON)

DOI: 10.1109/tencon61640.2024.10902913

Authors: Guillaume Keifer U. Arenas, Mystro Yushi P. Fujii, Anastine Beatrice B. Josue, Vincent Andrew Mikael C. Mataragnon, Jason L. Española, Kate G. Francisco, Jose Martin Z. Maningo, Argel A. Bandala, Ryan Rhay P. Vicerra, Elmer P. Dadios

Institution: De La Salle University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408258538

FWCI:

Cites: 20

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Related to: 10