Work

Lot Quality Prediction in Semiconductor Manufacturing Final Test Using Multilayer Perceptron

Year: 2024

Type: conference-paper

Source: IEEE Region 10 Conference (TENCON)

DOI: 10.1109/tencon61640.2024.10903083

Authors: Ranzel V. Dimaculangan, Robert G. De Luna

Institutions: Polytechnic University of the Philippines, Polytechnic University of the Philippines-Sto. Tomas

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408258690

FWCI: 0.754

Cites: 17

Cited by: 1

Related to: 10