Work

Impact of charging profiles on cumulative semiconductor damage used in EV chargers

Year: 2024

Type: conference-paper

Source: Proceedings of the Annual Conference of the IEEE Industrial Electronics Society

DOI: 10.1109/iecon55916.2024.10905799

Authors: Alexander Palacio, Abraham M. Alcaide, Juan Jose Porras, Hugues Renaudineau, Samir Kouro

Institutions: Universidad Técnica Federico Santa María, Universidad de Sevilla

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4408280971

FWCI: 1.611

Cites: 21

Cited by: 2

Related to: 10