A Study on The Reliability Analysis of The Integrated Dual-output Converter Using The Bayesian Networks
Year: 2024
Type: conference-paper
Authors: Mahdi Ghavaminejad, Mengqi Wang, Wencong Su, DucDung Le, Shahid Aziz Khan
Institution: University of Michigan–Dearborn
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408281195