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Open-Circuit Fault Diagnosis For Power Modules Based on Light Gradient Boosting Machine

Year: 2024

Type: conference-paper

Source: Proceedings of the Annual Conference of the IEEE Industrial Electronics Society

DOI: 10.1109/iecon55916.2024.10905252

Authors: Quanxue Guan, Jiabei Hu, Xue Hu, Di Zhou

Institutions: Sun Yat-sen University, Hong Kong Polytechnic University, Shenzhen Academy of Metrology and Quality Inspection

Language: English

Topic: Electrical Fault Detection and Protection

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

Funder: Research and Development

OpenAlex ID: W4408281819

FWCI: 1.612

Cites: 19

Cited by: 2

Related to: 10