Work

Evaluation of SiC JFET/Si-pMOS switch under high temperature operating life test and repetitive current limitation conditions for space applications

Year: 2024

Type: conference-paper

Source: Proceedings of the Annual Conference of the IEEE Industrial Electronics Society

DOI: 10.1109/iecon55916.2024.10905788

Authors: A. Garrigós, D. Marroquí, E. Maset, D. Alcaraz, G. Terol, J. M. Blanes

Institutions: Universitat de Miguel Hernández d'Elx, Universitat de València

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408281908

FWCI:

Cites: 4

Cited by:

Related to: 10