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MTDC Fault Detection and Localization Using High-Pass Filter

Year: 2024

Type: conference-paper

Source: Proceedings of the Annual Conference of the IEEE Industrial Electronics Society

DOI: 10.1109/iecon55916.2024.10905936

Authors: Saad Ahmed Khan, Abhisek Ukil, Nirmal-Kumar C. Nair, Dongyu Li

Institutions: University of Auckland, East China Jiaotong University

Language: English

Topic: HVDC Systems and Fault Protection

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408281941

FWCI: 0.806

Cites: 25

Cited by: 1

Related to: 10