Work

Improving Data Quality for Prognostic Learning Systems Considering Complex Degradation Patterns

Year: 2024

Type: conference-paper

Source: Proceedings of the Annual Conference of the IEEE Industrial Electronics Society

DOI: 10.1109/iecon55916.2024.10905515

Authors: Tarek Berghout, Yassine Amirat, Demba Diallo, Wei Hong Lim, Mohamed Benbouzid

Institutions: University of Batna 2, Centre National de la Recherche Scientifique, Université Paris-Saclay, Laboratoire de Génie Électrique et Électronique de Paris, UCSI University, Université de Bretagne Occidentale, Institut de Recherche Dupuy de Lôme

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408282248

FWCI: 0.722

Cites: 17

Cited by: 1

Related to: 10