Work

Open Circuit Fault Identification Technique for Switch and Diode in a Reduced Sensor Based Medium Voltage MMC

Year: 2025

Type: article

Source: IEEE Transactions on Industrial Electronics

DOI: 10.1109/tie.2025.3544226

Authors: Rupam Chaki, Anubrata Dey

Institution: Indian Institute of Technology Roorkee

Language: English

Topic: HVDC Systems and Fault Protection

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408324380

FWCI: 1.386

Cites: 27

Cited by: 6

Related to: 10