Work

An Extended Gamma Process for Accelerated Destructive Degradation Test: Modeling and Optimal Design

Year: 2025

Type: article

Source: IEEE Transactions on Reliability

DOI: 10.1109/tr.2025.3544545

Authors: Man Ho Ling, Suk Joo Bae, Shengxin Jin, Hon Keung Tony Ng

Institutions: Education University of Hong Kong, Hanyang University, Bentley University

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Research Foundation of Korea, Education University of Hong Kong

OpenAlex ID: W4408324774

FWCI: 2.33

Cites: 66

Cited by: 4

Related to: 10