Work

End-to-End Fast Segmentation Framework for 3D Visual Inspection of HBMs

Year: 2024

Type: conference-paper

Source: IEEE Electronics Packaging Technology Conference (EPTC)

DOI: 10.1109/eptc62800.2024.10909770

Authors: Jie Wang, Richard Chang, Meng Keong Lim, Ser Choong Chong, Xulei Yang, Ramanpreet Singh Pahwa

Institutions: Agency for Science, Technology and Research, Institute for Infocomm Research

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408325381

FWCI: 1.441

Cites: 8

Cited by: 2

Related to: 10