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Finite Element Analysis of Interfacial Delamination in Double Side Molding Power Module SiP During Reflow

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Year: 2024
Type: conference-paper
Source: IEEE Electronics Packaging Technology Conference (EPTC)
DOI: 10.1109/eptc62800.2024.10909903
Authors: Linjie Liao, Ping Wu, Yiou Qiu, Wenhui Zhu, Liancheng Wang
Institution: Central South University
Language: English

Topic: Electronic Packaging and Soldering Technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: Key Research and Development Program of Hunan Province of China, Natural Science Foundation for Distinguished Young Scholars of Hunan Province
Awards: G331538616, G7934430222
OpenAlex ID: W4408325399
FWCI:
Cites: 5
Cited by:
Related to: 10
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