Work

Analysis of Indium-Silver Alloy Thermal Interface Material Reliability and Coverage Degradation Mechanisms

Year: 2024

Type: conference-paper

Source: IEEE Electronics Packaging Technology Conference (EPTC)

DOI: 10.1109/eptc62800.2024.10909853

Authors: MinJae Kong, DongHyeon Park, Won Ree, YoungJun Koo, JoHyun Bae, YeonKi Jeong, EunSook Sohn, DongSu Ryu, DongJoo Park, KyungRok Park

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408325576

FWCI:

Cites: 7

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Related to: 10