Work

Equivalent Electromagnetic Radiation Model of Chip Based on Near-Field Scanning for EMI Analysis in Ceramic SiP

Year: 2024

Type: conference-paper

Source: IEEE Electronics Packaging Technology Conference (EPTC)

DOI: 10.1109/eptc62800.2024.10909891

Authors: Yaya Liang, Pan Ren, Wei Zhang, Xiaojie Li, Cong Liu, Pingan Du

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G7283493668

OpenAlex ID: W4408325704

FWCI: 0.806

Cites: 10

Cited by: 1

Related to: 10