Work

Simulation, Verification, and Failure Analysis of Fast Recovery Diodes for the Surge Current Capability

Year: 2024

Type: conference-paper

Source: IEEE Electronics Packaging Technology Conference (EPTC)

DOI: 10.1109/eptc62800.2024.10909923

Authors: Hao Guan, Yifei Chang, Lina Qi, Pan Liu

Institution: Fudan University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408325938

FWCI:

Cites: 10

Cited by:

Related to: 10