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Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy (Adv. Funct. Mater. 11/2025)

Year: 2025

Type: article

Abstract: Ferroelectric Polarization Switching Scanning probe microscopy of ferroelectric materials faces challenges in accurately measuring coercive voltages due to the dielectric gap between the probe tip and sample surface. In article number 2406944, Lane W. Martin, Seungbum Hong, and co-workers reveal how different dielectric media in this gap significantly influence measurement outcomes. Using water as a high-permittivity medium (ϵr = 79) enables more reliable measurements that closely match conventional capacitor-based studies, providing a pathway to accurate quantitative analysis of ferroelectric materials.

Source: Advanced Functional Materials

DOI: 10.1002/adfm.202570066

Authors: Seongmun Eom, Pravin Kavle, Deokyoung Kang, Yeongyu Kim, Lane W. Martin, Seungbum Hong

Institutions: Korea Advanced Institute of Science and Technology, Rice University, University of California, Berkeley

Language: English

Topic: Ferroelectric and Piezoelectric Materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W4408337745

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