Work

Resilient Test-Time Adaptation by Mitigating Batch-Normalization Overfitting

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Acoustics Speech and Signal Processing

DOI: 10.1109/icassp49660.2025.10888647

Authors: Xingzhi Zhou, Boyang Zhang, Zhiliang Tian, Yibo Zhang, Xin Niu, Ka Chun Cheung, Simon See, Nevin L. Zhang

Institutions: Hong Kong University of Science and Technology, National University of Defense Technology, Nvidia (United States)

Language: English

Topic: Domain Adaptation and Few-Shot Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W4408355689

FWCI: 1.982

Cites: 25

Cited by: 2

Related to: 10