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Microdosimetry of Very-High-Energy Heavy Ion Beams for Electronics Testing Using Silicon-on-Insulator Detectors

Year: 2025
Type: article
Abstract: This article explores the use of microdosimetry with a silicon-on-insulator (SOI) detector for characterizing very-high-energy (VHE) heavy ion beams used specifically for single event effect (SEE) testing of electronics. The detector was deployed at CERN’s heavy ion facility for radiation effects testing and exposed to lead ion beams in the 100–1000 MeV per nucleon kinetic energy range. The implications and possible benefits of using microdosimetry for SEE testing purposes are discussed.
DOI: 10.1109/tns.2025.3550471
Authors: Andreas Waets, Natalia Emriskova, Ruben Garcia Alia, Karolina Klimek, Vladimir Pan, Anatoly Rosenfeld, Linh T. Tran, James Vohradsky, Angela Kok, Marco Povoli, Petteri Nieminen, Uwe Schneider
Institutions: European Organization for Nuclear Research, University of Wollongong, SINTEF, European Space Agency, European Space Research and Technology Centre, University of Zurich
Language: English
Open Access status: hybrid
Estimated APC paid: $2,645
OpenAlex ID: W4408358265
FWCI: 0.68
Cites: 24
Cited by: 3
Related to: 10