Work

Deep Learning-Based Image Processing for Defect Detection in Electronic Components Manufacturing

Year: 2024

Type: conference-paper

Source: International Conference on Innovative Computing, Intelligent Communication and Smart Electrical Systems (ICSES)

DOI: 10.1109/icses63760.2024.10910791

Authors: B. Mathivanan, J. Maruthupandi, Namala Vijaya Lakshmi, S Suvitha, K. Karthik, Anand Swaroop

Institutions: Sri Ramakrishna Engineering College, New Horizon College of Engineering

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408358295

FWCI: 0.722

Cites: 10

Cited by: 1

Related to: 10