An Integrated Platform for Lie Detection and Plagiarism analysis in Interviews
Year: 2024
Type: conference-paper
Authors: S Snehalakshmi, S A Lakshmanan, B Devanathan
Institution: Amrita Vishwa Vidyapeetham
Language: English
Subfield: Social Psychology
Field: Psychology
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W4408358640