Work

Unveiling Textile Defects a Novel Fabric Defect Identification Based on Integrated Image Processing with Logical Learning Scheme

Year: 2024

Type: conference-paper

Source: International Conference on Innovative Computing, Intelligent Communication and Smart Electrical Systems (ICSES)

DOI: 10.1109/icses63760.2024.10910829

Authors: K. Ashok Kumar, Gururaj. D, K.Vidhya Lakshmi, I. Chandra, R. Kamalakannan, G Praveen Kumar

Institutions: Sri Ramakrishna College of Arts and Science, Rajalakshmi Engineering College, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, St. Joseph's Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408359405

FWCI: 0.723

Cites: 10

Cited by: 1

Related to: 10