Work

Enhancing Si MOSFET Reliability: Short-Circuit Protection Design, Analysis, and Experimental Validation

Year: 2025

Type: conference-paper

Source: Power Electronics, Drive Systems, and Technologies Conference (PEDSTC)

DOI: 10.1109/pedstc65486.2025.10911995

Authors: Poriya Amerian, Mostafa Zarghani, Abbas Sheikhi Azizi, Shahriyar Kaboli

Institution: Sharif University of Technology

Language: English

Topic: Advanced DC-DC Converters

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4408359529

FWCI: 2.358

Cites: 13

Cited by: 1

Related to: 10