Unveiling the Dynamics of Frenkel Defects in Fluoride Materials for X‐Ray‐Induced Persistent Luminescence and Advanced Imaging Applications
Year: 2025
Type: article
Source: Laser & Photonics Review
Institution: Henan University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Awards: G4025133226, G5078575912, G5549782609
OpenAlex ID: W4408383854
