Evading Detection Actively: Toward Anti-Forensics Against Forgery Localization
Year: 2025
Type: article
Authors: Long Zhuo, Shenghai Luo, Shunquan Tan, Han Chen, Bin Li, Jiwu Huang
Institution: Shenzhen MSU-BIT University
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Awards: G3775595010, G7142034960
OpenAlex ID: W4408396701
