Automated Dress Code Compliance Monitoring using YOLO based Models
Year: 2025
Type: conference-paper
Authors: Sudharshan R, Karthikeyan. P, Thirumalai Murugan R, Kandavel N, Latheesh Saran S
Institution: Indian Institute of Technology Madras
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408400512
