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DLPW-YOLO: A Lightweight Fabric Defect Detection Model Based on the Improved YOLOv8n

Year: 2024

Type: conference-paper

DOI: 10.1109/icftic64248.2024.10913284

Authors: Qianlie Lv, Peirui Bai, Hao Liang, Yanshuai Hu, Youpeng Liu, Yuemin Wang, Yingxia Fu

Institutions: Shandong University of Science and Technology, Yantai Nanshan University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408402047

FWCI: 1.51

Cites: 16

Cited by: 2

Related to: 10