Work

Reliability analysis of half-/full-bridge hybrid MMCs based on submodule correlation

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2025.0701

Authors: Siyi Xia, Yunfeng Li, Hangyu Wei, Yu Zhang

Institution: Changsha University of Science and Technology

Language: English

Topic: HVDC Systems and Fault Protection

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408413255

FWCI:

Cites:

Cited by:

Related to: 10