Reliability Enhancement of Memristor-Based Neural Networks with Fault-Injected Training
Year: 2024
Type: conference-paper
Authors: Md. Sihabul Islam, Ryota Eguchi, Michiko Inoue
Institution: Nara Institute of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408443071