Quantifying Patterned Features on Material Surfaces Created using Ga Ion Beam in FIB-SEM
Year: 2025
Type: article
Source: Microscopy and Microanalysis
DOI: 10.1093/mam/ozaf001
Authors: Supriya Ghosh, K Andre Mkhoyan
Institutions: University of Minnesota, University of Minnesota System
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408506826
