Analysis and optimization of optical device packaging stress failure based on low temperature environment
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3061774
Authors: XIAOJIE ZHANG, XI ZHEN, MAOSHUN DU, DONGXU ZHANG, RUSHENG PAN
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408507871
