Work

X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation

Year: 2024

Type: article

Source: Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques

DOI: 10.1134/s1027451024701854

Authors: D. Zverev, M. Sorokovikov, V. Yunkin, S. Kuznetsov, A. Snigirev

Institutions: Immanuel Kant Baltic Federal University, Institute of Microelectronics Technology and High Purity Materials

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408521859

FWCI:

Cites: 21

Cited by:

Related to: 10