Work

The Influence of Charged Conductive Atomic-Force Microscope Tip on Regimes of Electronic Transport in Diffusive Doped InAs Nanowire

Year: 2024

Type: article

Source: Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques

DOI: 10.1134/s102745102470188x

Author: A. A. Zhukov

Institutions: Russian Academy of Sciences, Osipyan Institute of Solid State Physics RAS

Language: English

Topic: Quantum and electron transport phenomena

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408522167

FWCI: 0.16

Cites: 27

Cited by: 1

Related to: 10