Work

Comparative Study of Thermal Stability of Transparent Conducting ITO/Ag/ITO and IGZO/Ag/IGZO Three-Layer Structures

Year: 2024

Type: article

Source: Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques

DOI: 10.1134/s1027451024701805

Authors: A. Sh. Asvarov, A. K. Akhmedov, E. K. Murliev, A. E. Muslimov, V. M. Kanevsky

Institutions: Russian Academy of Sciences, Kurchatov Institute, Institute of Physics. HI Amirkhanova, A.V. Shubnikov Institute of Crystallography

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408522794

FWCI:

Cites: 22

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Related to: 10