Work

Image denoising algorithm based on double branching for critical dimension scanning electron microscopy

Year: 2025

Type: article

Source: Journal of Micro/Nanopatterning Materials and Metrology

DOI: 10.1117/1.jmm.24.1.014004

Authors: Sa Liu, Fuqin Deng, Yanan Zhu, Zhuming Liu

Institutions: Wuyi University, Wuyi University, Guangdong Academy of Sciences, Institute of Semiconductors

Language: English

Topic: Image and Signal Denoising Methods

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408548926

FWCI:

Cites: 34

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Related to: 10