Work

Demonstration of 3-in full-wafer monolithic fabrication and wafer-level testing of MEMS-tunable single-mode ~1060nm VCSELs

Year: 2025
Type: conference-paper
Authors: Wan Ying Ho, Calisto Ruiz, Douglas Eber, Daniel Kaas, Hany Issa, David Lyon, Colin Iversen, Alexander Yang, John V. Hryniewicz, Vijaysekhar Jayaraman, Christopher Burgner
Language: English
Open Access status: closed
OpenAlex ID: W4408601661
FWCI:
Cites: 11
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Related to: 10