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A Re-investigation of Coupled Microstrip Line for Crack Sensing

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Year: 2024
Type: conference-paper
Source: IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications
DOI: 10.1109/mape62875.2024.10924463
Authors: Jun Zhang, Xuan Xie, Liu Tao
Institution: Guangdong University of Technology
Language: English

Topic: Microwave and Dielectric Measurement Techniques
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W4408611756
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Cites: 10
Cited by:
Related to: 10
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