Work

Combining machine learning and Fourier optics for fluorescence microscopy aberration correction

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3043057

Authors: Sean Turner, Scott Bender, Charles A. DiMarzio

Institutions: Northeastern University, IDEXX Laboratories (United States)

Language: English

Topic: Image Processing Techniques and Applications

Subfield: Media Technology

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408654187

FWCI: 1.774

Cites: 12

Cited by: 1

Related to: 10