Reliability of III-V/Si heterogeneously integrated lasers
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3043449
Authors: Felipe Vallini, Karthik Narayanan, Christopher Helms, Wendai Wang, George A. Ghiurcan, Pierre Doussiere, Richard Jones, Isako Hoshino, Quan A. Tran, Kishore Kamath
Institution: Intel (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408665374