Work

Interpretable Feature Graph Response and Inference Network for Complex Defect Detection of Flip Chip

Year: 2024

Type: conference-paper

Source: International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)

DOI: 10.1109/icsmd64214.2024.10920575

Authors: Siyu Zhang, Ke Li, Fucai Li

Institutions: Shanghai Jiao Tong University, Jiangnan University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408696715

FWCI:

Cites: 12

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Related to: 10