Work

A Cosine-Weighted Interactive Enhancement Network for Wafer Map Defect Recognition with a Pretrain-Finetune Strategy

Year: 2024

Type: conference-paper

Source: International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)

DOI: 10.1109/icsmd64214.2024.10920561

Authors: Shulong Gu, Zihao Lei, Di Zhao, Rui Feng, Yu Su, Guangrui Wen

Institution: Xi'an Jiaotong University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G8998506761

OpenAlex ID: W4408700815

FWCI:

Cites: 19

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Related to: 10