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A Dual-Constraint Centroid Contrastive Prototypical Network for Flip Chip Defect Detection Under Limited Labeled Data

Year: 2024

Type: conference-paper

Source: International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)

DOI: 10.1109/icsmd64214.2024.10920496

Authors: Yunxia Lou, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael Pecht

Institutions: Jiangnan University, University of Maryland, College Park

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408712325

FWCI:

Cites: 20

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Related to: 10