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Deep Learning: Exploring the Depths of Artificial Neural Networks for Advanced Data Analysis and Pattern Recognition

Year: 2024

Type: conference-paper

Source: IEEE Global Conference for Advancement in Technology (GCAT)

DOI: 10.1109/gcat62922.2024.10923983

Authors: Rajesh Jagadeesan Ravikumar, A. Ammupriya, Devi.P.P, V.Samuthira Pandi, Akhila Akula, K. Sankar

Institutions: St. Joseph’s College of Engineering, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Rajalakshmi Engineering College

Language: English

Topic: Neural Networks and Applications

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408716941

FWCI: 2.061

Cites: 15

Cited by: 7

Related to: 10