Work

Enhanced Bug Detection in Compiler Logs Using Stacking and Explainable AI Techniques

Year: 2024

Type: conference-paper

Source: IEEE Global Conference for Advancement in Technology (GCAT)

DOI: 10.1109/gcat62922.2024.10924112

Authors: Aayushi Jeeban Tripathy, Subhiksha Suresh Rao, Siddhant Ashwani, Kavitha C. R.

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408717198

FWCI: 1.157

Cites: 14

Cited by: 3

Related to: 10